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Applied scanning probe methods / B. Bhushan, H. Fuchs, S. Hosaka. — Berlin; Heidelberg; New York: Springer, 2004. — XX,476 p.: ill.; 24 cm. — (Nanoscience and technology, 1434-4904). — Bibliogr. at the end of the chapters. — ISBN 3-540-00527-7.
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